TI中文支持网关于8148的DDR3参数设置，
在TI官网上http://processors.wiki.ti.com/index.php/TI814x-DDR3-Init-U-Boot
有这么个介绍，需要使用CCS通过JTAG仿真器运行TI提供的一个.out程序来获取优化的参数，
但是，我们的板子JTAG口没法连接上。
我想请教一下，除了通过运行上述.out程序的方式，还有其他不需要JTAG的方式来得到优化的DDR3参数吗？
Eason Wang：
Sorry, 目前没有其他办法。因为DDR leveling 是一个程序，本身需要内存空间来运行这个程序的，而做leveling的时候，DDR本身又是不可被该程序占用的 ， so, 只有用仿真器才可以。
你的JTAG不能连上，指的是没有连线出来还就是连接有故障？是否可以看看这个问题能不能解？
bee：
回复 Eason Wang:
JTAG线连出来了，但是仿真器连接失败，使用xds100v2、seed-xds510plus均无法连接。
CCS5.2环境下，Test Connection的时候，打印以下消息，是什么原因呢？
[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\DOCUME~1\ADMINI~1\LOCALS~1\APPLIC~1\.TI\
213602635\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 30 2012'.
The library build time was '22:52:27'.
The library package version is '5.0.747.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End]
Eason Wang：
回复 bee:
1. 仿真器自检是否通过？
2. 尝试改小TCLK的频率实验一下
3. 芯片上，JTAG的电源是否接对？
