TI中文支持网Trouble Reading PC Register: Error 0x00000004/-1156 Error during: Register,
Lost processor clock. Device may be operating in a low-power mode. Do you want to bring it out of this mode?
Failed to remove the debug state from the target before disconnecting.
There may still be breakpoint opcodes embedded in program memory. It is recommended that you reset the emulator before you connect and reload your program before you continue debugging.
Young Hu：
1. USB线加磁环；
2. 电源电压，晶振有没有问题？
Trouble Reading PC Register: Error 0x00000004/-1156 Error during: Register,
Lost processor clock. Device may be operating in a low-power mode. Do you want to bring it out of this mode?
Failed to remove the debug state from the target before disconnecting.
There may still be breakpoint opcodes embedded in program memory. It is recommended that you reset the emulator before you connect and reload your program before you continue debugging.
user3636798：
回复 Young Hu:
您好 usb的线本身是带磁环的 而且换了两个不同的dsp的板子都是这样的情况 另外还有一点 就是ccs报错之后 桌面一般会弹出一个显示usb问题的提示框
求解决方法
Trouble Reading PC Register: Error 0x00000004/-1156 Error during: Register,
Lost processor clock. Device may be operating in a low-power mode. Do you want to bring it out of this mode?
Failed to remove the debug state from the target before disconnecting.
There may still be breakpoint opcodes embedded in program memory. It is recommended that you reset the emulator before you connect and reload your program before you continue debugging.
user3636798：
回复 Young Hu:
请问有人知道这个问题吗？
Trouble Reading PC Register: Error 0x00000004/-1156 Error during: Register,
Lost processor clock. Device may be operating in a low-power mode. Do you want to bring it out of this mode?
Failed to remove the debug state from the target before disconnecting.
There may still be breakpoint opcodes embedded in program memory. It is recommended that you reset the emulator before you connect and reload your program before you continue debugging.
Hardy Hu：
回复 user3636798:
你好！
这个问题在调试电机时经常出现，主要就是电机启动的强电磁干扰把调试器USB线上的数据全部扰乱了。
需要从连个地方进行改进，1是调试器与 MCU加隔离，2是USB线尽量短且加一个大一些的磁环。
