TI中文支持网问题：
C6678LE的板子，上周五连还可以，今天下午连的时候，仿真器三个LED灯一起闪烁（D1D2D3，红绿黄），电脑无法检测到仿真器连接，无论是USB口看还是test connection尝试。网上一些帖子说是安全模式，尝试了之后报错。好着急，不会是我把板子玩坏了吧…
板子闪烁图：
连接无法检测：
在CCSV6中test connection的错误日志：
[Start: Blackhawk XDS560v2-USB Mezzanine Emulator_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag.exe -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\ZWJ\AppData\Local\TEXASI~1\CCS\
ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 560/2xx-class product.
This utility will load the program 'bh560v2u.out'.
E_RPCENV_IO_ERROR(-6) No connection: emulator was not found
Download failed for file C:\ti\ccsv6\ccs_base\common\uscif\xds560v2.out
An error occurred while soft opening the controller.
—–[An error has occurred and this utility has aborted]——————–
This error is generated by TI's USCIF driver or utilities.
The value is '-250' (0xffffff06).
The title is 'SC_ERR_ECOM_EMUNAME'.
The explanation is:
An attempt to access the debug probe via USCIF ECOM has failed.
[End: Blackhawk XDS560v2-USB Mezzanine Emulator_0]
尝试调整安全模式的错误：
user6041600：
回复 Shine:
这个板子上是不是还有其他的仿真器？我这里没有其他的仿真器了… 那是不是可以确定是硬件的问题，不是驱动或者其他？
Nancy Wang：
回复 user6041600:
板子上应该有个usb xds100仿真器吧。
user6041600：
回复 Nancy Wang:
是的，我刚才把XDS560卸了下来用XDS100，串口能够被识别，并且显示了名称。CCS的ccxml文件如图配置，但test connection最后还是出现报错，请问这个代表是560有问题还是板子有问题..：
test connection如下：
[Start: Texas Instruments XDS100v1 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\ZWJ\AppData\Local\TEXASI~1\CCS\ ti\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.This utility will load the adapter 'jioserdesusb.dll'.The library build date was 'Apr 8 2016'.The library build time was '02:44:08'.The library package version is '6.0.222.0'.The library component version is '35.35.0.0'.The controller does not use a programmable FPGA.The controller has a version number of '4' (0x00000004).The controller has an insertion length of '0' (0x00000000).This utility will attempt to reset the controller.This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.The controller is the FTDI FT2232 with USB interface.The link from controller to target is direct (without cable).The software is configured for FTDI FT2232 features.The controller cannot monitor the value on the EMU[0] pin.The controller cannot monitor the value on the EMU[1] pin.The controller cannot control the timing on output pins.The controller cannot control the timing on input pins.The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 64 32-bit words.This test will be applied just once.
Do a test using 0xFFFFFFFF.Scan tests: 1, skipped: 0, failed: 0Do a test using 0x00000000.Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.The details of the first 8 errors have been provided.The utility will now report only the count of failed tests.Scan tests: 2, skipped: 0, failed: 1Do a test using 0xFE03E0E2.Scan tests: 3, skipped: 0, failed: 2Do a test using 0x01FC1F1D.Scan tests: 4, skipped: 0, failed: 3Do a test using 0x5533CCAA.Scan tests: 5, skipped: 0, failed: 4Do a test using 0xAACC3355.Scan tests: 6, skipped: 0, failed: 5Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v1 USB Debug Probe_0]
debug时：
user6041600：
回复 Shine:
能麻烦你看下最下面的问题吗，谢谢~
q zhao：
回复 user6041600:
如果是下面这个的话，上面提示没有检测到JTAG的CLK，下面是SCAN未通过，请量一下DSPJTAG各个信号是否正常
Shine：
回复 user6041600:
如果板载仿真器不行的话，可能是板子的问题了。像楼上说的，先测一下JTAG口信号。
另外，Mezzanine Card 是不建议插拔的。
processors.wiki.ti.com/…/Connecting_To_An_LCEVM_with_CCS
