TI中文支持网#include <msp430.h>
unsigned int ADC_Result[13]; // 12-bit ADC conversion result array
unsigned char i;
#define CALADC_15V_30C *((unsigned int *)0x1A1A) // Temperature Sensor Calibration-30 C
// See device datasheet for TLV table memory mapping
#define CALADC_15V_85C *((unsigned int *)0x1A1C) // Temperature Sensor Calibration-High Temperature (85 for Industrial, 105 for Extended)
int main(void)
{
WDTCTL = WDTPW | WDTHOLD; // Stop WDT
// Configure ADC
// Configure ADC A1 pin
P5SEL0 |= BIT0;
P5SEL1 |= BIT0;
ADCCTL0 |= ADCSHT_8 | ADCON; // ADCON, S&H=16 ADC clks
ADCCTL1 |= ADCSHP | ADCCONSEQ_1 | ADCSSEL_1; // ADCCLK = MODOSC; sampling timer
ADCCTL2 &= ~ADCRES; // clear ADCRES in ADCCTL
ADCCTL2 |= ADCRES_2; // 12-bit conversion results
ADCIE |= ADCIE0; // Enable ADC conv complete interrupt
ADCMCTL0 = ADCINCH_12 | ADCSREF_1; // A1 ADC input select; Vref=2.5V
// Configure reference module
PMMCTL0_H = PMMPW_H; // Unlock the PMM registers
PMMCTL2 |= INTREFEN | REFVSEL_2 | TSENSOREN ; // Enable internal 2.5V reference
__delay_cycles(400); // Delay for reference settling
_EINT();
while(1)
{
while(ADCCTL2 & ADCBUSY); // Wait if ADC core is active
ADCCTL0 |= ADCENC | ADCSC; // Sampling and conversion start
__delay_cycles(5000);
}
}
// ADC interrupt service routine
#if defined(__TI_COMPILER_VERSION__) || defined(__IAR_SYSTEMS_ICC__)
#pragma vector=ADC_VECTOR
__interrupt void ADC_ISR(void)
#elif defined(__GNUC__)
void __attribute__ ((interrupt(ADC_VECTOR))) ADC_ISR (void)
#else
#error Compiler not supported!
#endif
{
volatile float temp;
volatile float IntDegF;
volatile float IntDegC;
switch(__even_in_range(ADCIV,ADCIV_ADCIFG))
{
case ADCIV_NONE:
break;
case ADCIV_ADCOVIFG:
break;
case ADCIV_ADCTOVIFG:
break;
case ADCIV_ADCHIIFG:
break;
case ADCIV_ADCLOIFG:
break;
case ADCIV_ADCINIFG:
break;
case ADCIV_ADCIFG:
ADC_Result[i] = ADCMEM0;
if(i == 0)
{
i =12;
temp =ADC_Result[11];
// Temperature in Celsius
// The temperature (Temp, C)=
IntDegC = (temp-CALADC_15V_30C)*(85-30)/(CALADC_15V_85C-CALADC_15V_30C)+30;
// Temperature in Fahrenheit
// Tf = (9/5)*Tc | 32
IntDegF = 9*IntDegC/5+32;
//__bic_SR_register_on_exit(LPM3_bits); // Exit LPM3
}
else
{
i–;
}
break;
default:
break;
}
}
Susan Yang：
您现在程序运行结果如何？
Susan Yang：
那您上述程序运行如何？是自己制作的板子？建议先运行下TI例程，看是否能正常采集转换
您可以参考下面的例子，是采集A2/A1/A0, 使用internal 2V Ref
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user5707170：
回复 Susan Yang:
采集到的数据很乱，下面是我采集到的数据感觉[0] 很像我内部温度的采集[9] 很像我A8通道的采集，是不是我哪里配置的错了，还是别的什么？求指点下，
ADC_Result unsigned int[13] [1303,2056,4095,1245,1488…] 0x002000 [0] unsigned int 1303 0x002000 [1] unsigned int 2056 0x002002 [2] unsigned int 4095 0x002004 [3] unsigned int 1245 0x002006 [4] unsigned int 1488 0x002008 [5] unsigned int 2415 0x00200A [6] unsigned int 4095 0x00200C [7] unsigned int 7250x00200E [8] unsigned int 510×002010 [9] unsigned int 00×002012 [10]unsigned int375 0x002014 [11]unsigned int 1038 0x002016 [12]unsigned int 1053 0x002018
刚才你说的配置A8 做了如下配置ADCMCTL0 =ADCINCH_12 | ADCINCH_8 | ADCSREF_1;// A8 ADC input select; Vref=2.5V
采集的结果就是上面的
Susan Yang：
回复 user5707170:
那您单独测A8或者A12呢？是否正常？
user5707170：
回复 Susan Yang:
我参考了这个例子// Configure ADC A1~2 pinsP1SEL0 |=BIT1 + BIT2;P1SEL1 |=BIT1 + BIT2;
这行配置好像没对A0 进行选择吧，我看了寄存器是没有，ADCMCTL0 |= ADCINCH_2 | ADCSREF_1;// A0~2(EoS); Vref=2V
咱们通道只指定了指定的2 通道循环从 0 1 2 采集，有没有办法不循环呢，指定几个通道进行循环， 比如248 三个通道进行循环 ，这样的话该如何进行配置，板子是我们自己的制作的，只是，我现在进行简单的多通道采集，然后单片机直接接地采集到数据就是错误的
user5707170：
回复 Susan Yang:
单独测试时OK的，我都单独测试过了，包含咱们温度提供的公式，都是正常的，还有就是A8 IO口我以前配置过，仅仅A8 口 没有什么问题，两个结合起来不知道如何配置下，咱们提供的例子，是指定循环0 1 2 的配置
