TIC10024-Q1: TIC10024QDCPRQ1 voltage acquisition detection failure

Dears:

At present, Customer has found that part of the channel level acquisition failure of TIC10024QDCPRQ1 chip in product fault analysis, and the relevant situation is described as follows:

1. Recently, the end customer has reported five set level acquisition failure, resulting in the failure of relevant functions to work normally, and it can be restored to normal after power failure and restart;

2. According to the current fault points, it can be seen that there are mainly abnormal channels IN1, IN5, IN15 and IN17;

3. The analysis of data read through CAN bus shows that the MCU master program logic runs normally, MCU reads input signals through SPI bus, and some channel signals are collected normally, which proves that SPI data is read normally;

4. Attached is our DI collection circuit diagram as follows.

Please provide technical support and analyze the possible causes of such faults based on the working principle of the chip.This matter is urgent, please deal with it as soon as possible, thank you!

Amy Luo：

您好，

感谢您对TI产品的关注！为更加有效地解决您的问题，我们建议您将问题发布在E2E英文技术论坛上（英文论坛对应子论坛链接：https://e2e.ti.com/support/interface-group/interface/f/interface-forum），将由资深的英文论坛工程师为您提供帮助。