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DRA725: 反复上下电测试造成寄存器值改变

Part Number:DRA725

TI chip:dra725

TI  sdk version:tisdk-rootfs-image-dra7xx-evm_vsdk_3_5

1、Switch machine test repeatedly, boot (14 v 1A 30 seconds) shutdown (0 v 10 seconds)

2、Phenomenon of the problem: After the test, The screen does not display, read the relevant register values, found DISPC_GFX_ATTRIBUTES values change
Relating to register:

Register

Normal value

fault value

DISPC_CONFIG1

0x00000C04

NULL

DISPC_CONFIG2

0x00000000

NULL

DISPC_CONFIG3

0x00000000

NULL

DISPC_GLOBAL_ALPHA

0xFFFFFFFF

NULL

DISPC_TRANS_COLOR0

0x00000000

NULL

DISPC_TRANS_COLOR1

0x00000000

NULL

DISPC_TRANS_COLOR2

0x00000000

NULL

DISPC_TRANS_COLOR3

0x00000000

NULL

DISPC_GFX_ATTRIBUTES

0x0E000891

0x0E0000A0

DISPC_VID1_ATTRIBUTES

0x02288873

NULL

DISPC_VID2_ATTRIBUTES

0x06008400

NULL

DISPC_VID3_ATTRIBUTES

0x0A288A60

NULL

Cherry Zhou:

Hi,

We've got the issue and escalated to e2e for more help, please see the link below:

https://e2e.ti.com/support/processors-group/processors/f/processors-forum/1117607/dra725-repeated-power-up-down-tests-caused-register-values-to-change

,

Cherry Zhou:

Hi,

Didn't get it. What you mean by null in the above table? Are they not readable? 

Thanks.

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