TI中文支持网Other Parts Discussed in Thread:TMS320C6678
就是用的板载仿真器，一直连接失败
IcePick_D: Error connecting to the target: (Error -2131 @ 0x0) Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 5.0.838.0)
[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\wgs\AppData\Local\.TI\213602635\
0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Aug 30 2012'.
The library build time was '21:58:20'.
The library package version is '5.0.838.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End]
Nancy Wang：
target configuration配置参考看一下是否正确。
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wang wang9：
这个地方的配置和这个是一样的。是xds100v1。
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wang wang9：
,
wang wang9：
我也是配置的 XDS100v1 USB Emulator. TMS320C6678
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Nancy Wang：
之前有连接成功过吗？COM口能否正常识别？驱动正常吗？
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wang wang9：
一直没连接上
COM口可以识别 驱动已经更新到最新了 这里怎么把截图发上来啊
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wang wang9：
7026.docx
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wang wang9：
5265.docx
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wang wang9：
图片
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wang wang9：
您好，麻烦跟进一下，这是我的配置截图和sw3,4,5,6拨码开关的配置图3252.配置.docx
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Nancy Wang：
启动模式修改成no boot试一下，即只将sw3 pin1 设为off。我看附件中的拨码开关反了。
另外板子上的SYSPG_D1 不亮 SYSPG_D1 Green All Power rails are stable on AMC ，我在测试手上的开发板时，是会亮的，检查一下供电有没有问题。
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wang wang9：
启动模式改过来了。连接了一下还是显示之前的问题。 SYSPG_D1 它只在上电的时候亮一下，然后就熄灭。这样的情况显示是正常的吗？还是应该一直在亮着？
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Nancy Wang：
请问是版本1吗？看一下图片中的已知问题。
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wang wang9：
附件里这张图片是版本号吗 我看写着 TMDSEVM6678L Rev.3B
7266.版本.docx
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wang wang9：
我在两个引脚之间接了一个5K的电阻，结果SYSPG_D1 还只在上电的时候亮一下，然后就熄灭。
我在不接电阻的情况下量了一下pin1 和 PIN5 的电阻值，大约为4.7K.
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Nancy Wang：
那你板子的版本应该不存在这样的问题。
有xds560仿真器吗？可以试一下能不能连上。您是从哪里购买的板子？
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wang wang9：
板子上的外接仿真口是60pin的，能使用平常常见的14或者20pin的仿真器吗？
包装盒上有原厂标签，附件里是我拍的一个图片。6661.标签.docx
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Nancy Wang：
需要买个转换器 60pin转14或者20的。
还是要看您购买的渠道。
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wang wang9：
在哪可以购买这种转换器？
找到了一下出货单 是 深圳市创芯联盟电子有限公司
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Nancy Wang：
看一下 Types of adapters：
dev.ti.com/…/node
其次建议您联系一下供货商问一下。
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wang wang9：
您好，如果返厂要怎么个流程？
