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TMS320F280049: cJTAG连接问题

Part Number:TMS320F280049

TMS320F280049芯片使用cJTAG-2PIN烧写模式,某单板正常使用一段时间后,用仿真器(TDS110或者TDS100v3)烧写新软件时,连接时报错,用该仿真器连接其他板正常,怀疑该板的DSP出现异常,请TI工程师分析一下是什么原因?

Test Connection记录如下:

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\wuqiang.000\AppData\Local\TEXASI~1\
CCS\ccs910\0\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Jun 3 2019'.
The library build time was '15:24:38'.
The library package version is '8.2.0.00004'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

—–[An error has occurred and this utility has aborted]——————–

This error is generated by TI's USCIF driver or utilities.

The value is '-230' (0xffffff1a).
The title is 'SC_ERR_PATH_MEASURE'.

The explanation is:
The measured lengths of the JTAG IR and DR scan-paths are invalid.
This indicates that an error exists in the link-delay or scan-path.

[End: Texas Instruments XDS110 USB Debug Probe_0]

Susan Yang:

您可以看一下下面链接的说明

http://software-dl.ti.com/ccs/esd/documents/ccsv7_debugging_jtag_connectivity_issues.html#path-measure 

user4678620 说:某单板正常使用一段时间后,用仿真器(TDS110或者TDS100v3)烧写新软件时

之前也是使用XDS110 cJTAG-2PIN烧录的?

,

user4678620:

看了链接的说明,对这个问题不适用;之前用XDS110 cJTAG-2PIN和XDS100 cJTAG-2PIN都烧录过。

1、没有使用CC13xx/CC26xx devices,使用的是C2000

2、没有使用XDS510-class debug probe,使用的是XDS110或XDS100v3

,

Susan Yang:

user4678620 说:之前用XDS110 cJTAG-2PIN和XDS100 cJTAG-2PIN都烧录过。

也就说您的仿真器是没有的。之前该板子可以烧录的话,说明板子之前是硬件正常的。

之前和现在使用的CCS版本是相同的吗?因为

http://software-dl.ti.com/ccs/esd/documents/xdsdebugprobes/emu_xds110.html#jtag-clock-speed-considerations 

The TI Emulators package (emupack) that ships with CCSv9.1.x versions (8.2.0.000xx) changed the default TCLK speed.

建议按照建议降低一下TCLK速度试试

,

user4678620:

CCS版本是一样的(Code Composer Studio 9.1.0)。TCLK速度由8.5MHz改为5MHz,现象一样,继续减小到1MHz及一下,报另一个故障

—–[An error has occurred and this utility has aborted]——————–

This error is generated by TI's USCIF driver or utilities.

The value is '-233' (0xffffff17).The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.An attempt to scan the JTAG scan-path has failed.The target's JTAG scan-path appears to be brokenwith a stuck-at-ones or stuck-at-zero fault.

[End: Texas Instruments XDS110 USB Debug Probe_0]

,

Susan Yang:

我是用launchpad 配合CCS10来测试的,之后使用CCS9.2来测试了8.5M的TCLK也是没有问题的

您使用的是独立仿真器?还是TI开发板?

,

user4678620:

使用的是独立仿真器,已确定DSP芯片出现异常:该板更换DSP芯片后可以正常烧录,异常DSP芯片焊到其他板,现象一样。

,

Susan Yang:

user4678620 说:已确定DSP芯片出现异常:

谢谢您的反馈

,

user4678620:

损坏原因能分析吗?

,

Susan Yang:

这需要知道您应用的详细情况。建议您重新发帖子说明一下,谢谢

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