TMDSDOCKH52C1: The JTAG IR and DR scan-paths cannot circulate bits

Hello everyone,

I really need some help. I have search the solution online for quite some time but get nothing similar or useful.

I'm trying to test the connection between XDS200 Emulator and the TMDSDOCKH52C1 Experimental Kit, but it doesn't work.

After connecting  XDS200 to JTAG (on control card from experimental kit) , the following errors appear:

[Start: Texas Instruments XDS2xx USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

—–[Print the board config pathname(s)]————————————

C:\Users\ADMINI~1\AppData\Local\TEXASI~1\
CCS\ccs910\1\0\BrdDat\testBoard.dat

—–[Print the reset-command software log-file]—————————–

This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Jun 3 2019'.
The library build time was '14:44:57'.
The library package version is '8.2.0.00004'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

—–[Print the reset-command hardware log-file]—————————–

This emulator does not create a reset log-file.

—–[An error has occurred and this utility has aborted]——————–

This error is generated by TI's USCIF driver or utilities.

The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.

[End: Texas Instruments XDS2xx USB Debug Probe_0]

The Target Configeration is:

Here are pics of the hardwares:

Green Deng：

你好，你用板子上自带的板载仿真器可以连接并仿真吗？