TI中文支持网我使用XDS100V2仿真器连接在CCS10环境下连接TMSF28379D时，connection会出现以下错误：
[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
—–[Print the board config pathname(s)]————————————
C:\Users\LIANGS~1\AppData\Local\TEXASI~1\
CCS\ccs1011\0\0\BrdDat\testBoard.dat
—–[Print the reset-command software log-file]—————————–
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 7 2020'.
The library build time was '21:10:18'.
The library package version is '9.2.0.00002'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
—–[Print the reset-command hardware log-file]—————————–
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
—–[The log-file for the JTAG TCLK output generated from the PLL]———-
There is no hardware for programming the JTAG TCLK frequency.
—–[Measure the source and frequency of the final JTAG TCLKR input]——–
There is no hardware for measuring the JTAG TCLK frequency.
—–[Perform the standard path-length test on the JTAG IR and DR]———–
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Test 5 Word 0: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 1: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 2: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 3: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 4: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 5: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 6: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
Test 5 Word 7: scanned out 0x5533CCAA and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 5, skipped: 0, failed: 1
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 2
Some of the values were corrupted – 32.8 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFFFFF071.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted – 65.6 percent.
The JTAG DR Integrity scan-test has failed.
[End]
和截图：
我感觉这个问题很罕见，我在网上没有搜索到相关的解决方法。
起初我怀疑是我的仿真器坏了，于是我用它（XDS100V2）去连接另一块28335试一下，结果是可行的，并且成功在28335上进行了DEBUG。但是回到这块28379上就不行。
之后我以为是28379有硬件问题，于是用手里的另一个XDS100V3试一下，结果XDS100V3能成功连接上28379（下载程序的时候报错了，仅能连接）。
请大家帮我看下这是啥问题，苦行僧。
Susan Yang：
您可以参考一下下面链接内的
software-dl.ti.com/…/ccsv7_debugging_jtag_connectivity_issues.html
If the data read is garbage such as in the example below, probably reflections on the JTAG line, loose target cables or connectors or problems on the PCB routing are most probably the root causes. Also, invalid configurations such as cJTAG/JTAG or a very high TCLK speed can cause garbled data to be read back.
您现在回读数据是随机的，则很可能是JTAG线反射，目标电缆或连接器松动或PCB布线问题。同样，无效的配置（例如cJTAG / JTAG或非常高的TCLK速度）也会导致读取乱码的数据。
,
user6024893：
谢谢苏珊(*^_^*)
,
Susan Yang：
不客气，很高兴能帮到您！
