TI中文支持网安装CCS10的时候，C6000和Keystone系列都选择安装了的，刚买了块EVMC6678LE这块官方板子，新建工程选择平台的时候没有这个板子的选项，然后创建targetconfigs的时候就只能选择TMS320C6678.ccxml这个配置文件了，再然后测试板载XDS100连接，结果报了好些错误
This path-length test uses blocks of 64 32-bit words.
The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.
The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.
—–[Perform the Integrity scan-test on the JTAG IR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG IR Integrity scan-test has failed.
—–[Perform the Integrity scan-test on the JTAG DR]————————
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted – 83.3 percent.
The JTAG DR Integrity scan-test has failed.
[End: Texas Instruments XDS100v1 USB Debug Probe_0]
针对我这情况该怎么办呢，另外，CCS路径下安装了ti\processor_sdk_rtos_c667x_6_03_00_106 和ti\pdk_c667x_2_0_16，PDK的测试例程都全部创建成功了，就等上面的问题解决了，希望TI的工程师帮帮忙，谢谢
Shine：
请看一下是否按照下面的wiki网站上的步骤操作的？特别是仿真器有没有选择xds100v1?
processors.wiki.ti.com/…/Connecting_To_An_LCEVM_with_CCS
user18914063：
回复 Shine:
好了，原来是要把板子上那个独立的XDS560V2仿真器拆下来，不然板载XDS100V1就默认被禁止了，刚编译了一个例程GPIO_LedBlink_C6678_EVM_c66xTestProject，编译通过，用XDS100V1进了调试状态，然后选目标的时候选了CPU0，代码能跑，但板子上的LED没有任何动作，是不是代码里控制的IO口和板子上的实际IO口不对应啊，这个官方的例程，我也没动过的
user18914063：
回复 user18914063:
另外，板子的原理图啥的，在官网上没看到有呢，有个第三方的链接，点进去后提示是这样的
We're sorry, but the page you're looking for is no longer avaliable
Shine：
回复 user18914063:
user18914063好了，原来是要把板子上那个独立的XDS560V2仿真器拆下来，不然板载XDS100V1就默认被禁止了，刚编译了一个例程GPIO_LedBlink_C6678_EVM_c66xTestProject，编译通过，用XDS100V1进了调试状态，然后选目标的时候选了CPU0，代码能跑，但板子上的LED没有任何动作，是不是代码里控制的IO口和板子上的实际IO口不对应啊，这个官方的例程，我也没动过的
Shine：
回复 user18914063:
user18914063另外，板子的原理图啥的，在官网上没看到有呢，有个第三方的链接，点进去后提示是这样的 We're sorry, but the page you're looking for is no longer avaliable
user18914063：
回复 Shine:
代码能正常跑，打过断点，以下代码都执行了，但是LED实际没有动作/* GPIO initialization */GPIO_init();
/* Set the callback function */GPIO_setCallback(USER_LED0, AppGpioCallbackFxn);
/* Enable GPIO interrupt on the specific gpio pin */GPIO_enableInt(USER_LED0);
/* Write high to gpio pin to control LED1 */GPIO_write((USER_LED1), GPIO_PIN_VAL_HIGH);AppDelay(DELAY_VALUE);
GPIO_log("\n GPIO Led Blink Application \n");#if defined(SOC_K2L) || defined(SOC_C6678) || defined(SOC_C6657)/* No GPIO pin directly connected to user LED's on K2L/C6678/C6657/AM65xx EVM, just trigger interrupt once */GPIO_toggle(USER_LED0);while (!gpio_intr_triggered);
UART_printStatus("\n All tests have passed \n");
尤其下面这段代码，在串口调试助手那里还正确显示了
UART_printStatus("\n All tests have passed \n");所以我觉得会不会是代码里定义的IO口和板子上实际的IO口不对应
user18914063：
回复 Shine:
这个网页打不开
Shine：
回复 user18914063:
user18914063这个网页打不开
Shine：
回复 user18914063:
user18914063代码能正常跑，打过断点，以下代码都执行了，但是LED实际没有动作 /* GPIO initialization */ GPIO_init(); /* Set the callback function */ GPIO_setCallback(USER_LED0, AppGpioCallbackFxn); /* Enable GPIO interrupt on the specific gpio pin */ GPIO_enableInt(USER_LED0); /* Write high to gpio pin to control LED1 */ GPIO_write((USER_LED1), GPIO_PIN_VAL_HIGH); AppDelay(DELAY_VALUE); GPIO_log("\n GPIO Led Blink Application \n"); #if defined(SOC_K2L) || defined(SOC_C6678) || defined(SOC_C6657) /* No GPIO pin directly connected to user LED's on K2L/C6678/C6657/AM65xx EVM, just trigger interrupt once */ GPIO_toggle(USER_LED0); while (!gpio_intr_triggered); UART_printStatus("\n All tests have passed \n"); 尤其下面这段代码，在串口调试助手那里还正确显示了 UART_printStatus("\n All tests have passed \n"); 所以我觉得会不会是代码里定义的IO口和板子上实际的IO口不对应
