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LAUNCHXL-F280039C: Program Download Failure

Part Number:LAUNCHXL-F280039COther Parts Discussed in Thread:C2000WARE

Program Download Failure 程序下载失败 程序下载失败 程序下载失败 程序下载失败

Symptoms: 症状:

  1. After DSP power-on: DSP上电后:

    • LED2 remains offLED2 保持熄灭(通常应闪烁或保持亮起)
    • LED3 stays constantly lit

  2. When testing DSP-PC connection, outputs:

    [Start: Texas Instruments XDS110 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

    [Result]

    —–[Print the board config pathname(s)]————————————

    C:\Users\83582\AppData\Local\TEXASI~1\CCS\
    ccs1260\0\0\BrdDat\testBoard.dat

    —–[Print the reset-command software log-file]—————————–

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioxds110.dll'.
    The library build date was 'Sep 26 2024'.
    The library build time was '10:09:41'.
    The library package version is '20.0.0.3178'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '5' (0x00000005).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    —–[Print the reset-command hardware log-file]—————————–

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the XDS110 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for XDS110 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    —–[Perform the Integrity scan-test on the JTAG IR]————————

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG IR Integrity scan-test has succeeded.

    —–[Perform the Integrity scan-test on the JTAG DR]————————

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.

    The JTAG DR Integrity scan-test has succeeded.

    [End: Texas Instruments XDS110 USB Debug Probe_0]

  3. 在测试数字信号处理(DSP)与个人电脑(PC)的连接时,输出:

    When flashing C2000Ware example program, displays:

    C28xx_CPU1: GEL Output:

    RAM initialization done

    C28xx_CPU1: GEL Output:Memory Map Initialization Complete
    C28xx_CPU1: GEL Output: … DCSM Initialization Start …C28xx_CPU1: GEL Output: … DCSM Initialization Done …
    C28xx_CPU1: GEL Output: … DCSM Initialization Start …C28xx_CPU1: GEL Output: … DCSM Initialization Done …

    在对 C2000Ware 示例程序进行闪存操作时,显示:

Taylor:

您好,

已经收到了您的案例,调查需要些时间,感谢您的耐心等待。

,

Lydia:

您好,

Lin Lu 说:在对 C2000Ware 示例程序进行闪存操作时,显示:

我认为帖子中缺少信息,您能否更新,以便我可以提供进一步的帮助?

,

Lin Lu:

问题已解决,可以烧录程序

,

Lydia:

您好,很高兴听到您的问题已解决,此贴关闭。

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